New Book on RFID Technology

Co-Edited by Professor John R. Williams

June 14, 2008

Cambridge University Press has published a new book, RFID Technology and Applications, co-edited by MIT Engineering Systems Division (ESD) Professor John R. Williams. Williams is also an Associate Professor of Information Engineering and Civil and Environmental Engineering, and is Director of the MIT Auto-ID Laboratory.

Professor Williams' work focuses on the architecting of large-scale distributed simulation systems. He was recently called one of the 50 most powerful people in networking, and serves as Co-Director of the global alliance of Auto-ID Laboratories. His co-editors are colleagues at MIT's Auto-ID Lab, Research Scientist Stephen B. Miles and Mechanical Engineering Associate Professor Sanjay E. Sarma, a Laboratory co-founder.

The new book details engineering issues in both passive and active RFID (radio frequency identification) automatic data capture technology, including in the retail supply chain. In addition, it includes discussions of tag performance optimization and RFID evaluation methodologies, and addresses future research and development challenges.