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June
14, 2008
Cambridge
University Press has published a new book, RFID
Technology and Applications, co-edited by MIT Engineering
Systems Division (ESD) Professor John R. Williams. Williams
is also an Associate Professor of Information Engineering
and Civil and Environmental Engineering, and is Director
of the MIT Auto-ID Laboratory.
Professor
Williams' work focuses on the architecting of large-scale
distributed simulation systems. He was recently called one
of the 50 most powerful people in networking, and serves
as Co-Director of the global alliance of Auto-ID Laboratories.
His co-editors are colleagues at MIT's Auto-ID Lab, Research
Scientist Stephen
B. Miles and Mechanical Engineering Associate Professor
Sanjay
E. Sarma, a Laboratory co-founder.
The
new book details engineering issues in both passive and
active RFID (radio frequency identification) automatic data
capture technology, including in the retail supply chain.
In addition, it includes discussions of tag performance
optimization and RFID evaluation methodologies, and addresses
future research and development challenges.
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